Keithley 2510 calibration and repair
Have your Keithley equipment calibrated in the ISO/IEC 17025 accredited lab!
Minerva is specialized in repair and calibration services of Keithley instruments. These Keithley instruments are calibrated in a ISO/IEC 17025 accredited calibration lab.
The calibration is performed by calibration technicians. We have more then 30 years of experience in calibrating instruments. In short, your Keithley instrument is taken good care off! We focus on a fast lead time and extremely high standard of our service.
Keithley 2510 Optical Source Meter
The Models 2510 and TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules. These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiberoptic telecommunications networks. Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing. It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately.
The Model 2510‑AT expands the capability of the Model 2510 by offering autotuning capability. P, I, and D (proportional, integral, and derivative) values for closed loop temperature control are determined by the instrument using a modified Zeigler-Nichols algorithm. This eliminates the need for users to determine the optimal values for these coefficients experimentally. In all other respects, the Model 2510 and Model 2510‑AT provide exactly the same set of features and capabilities.
The SourceMeter Concept
The Model 2510 draw upon Keithley’s unique SourceMeter concept, which combines precision voltage/current sourcing and measurement functions into a single instrument. SourceMeter SMU instruments provide numerous advantages over the use of separate instruments, including lower acquisition and maintenance costs, the need for less rack space, easier system integration and programming, and a broad dynamic range.
Part of a Comprehensive LIV Test System
In a laser diode CW test stand, the Model 2510 can control the temperature of actively cooled optical components and assemblies (such as laser diode modules) to within ±0.005°C of the user-defined setpoint. During testing, the instrument measures the internal temperature of the laser diode module from any of a variety of temperature sensors, then drives power through the TEC within the laser diode module in order to maintain its temperature at the desired setpoint.
